One Bit Sensing, RIP bounds and Empirical Processes

Series: 
Analysis Seminar
Wednesday, January 27, 2016 - 14:00
1 hour (actually 50 minutes)
Location: 
Skiles 005
,  
Gatech
Organizer: 
A signal is a high dimensional vector x, and a measurement is the inner product .  A one-bit measurement is the sign of .   These are basic objects, as will be explained in the talk, with the help of some videos of photons.  The import of this talk is that  one bit measurements can be  as effective as the measurements themselves, in that the same number of measurements in linear and one bit cases ensure the RIP property.  This is explained by a connection with variants of classical spherical cap discrepancy.  Joint work with Dimtriy Bilyk.